Author Description

Volume is indexed by Thomson Reuters CPCI-S (WoS). This second collection on “Advanced Measurement and Test II” is dedicated to the electronic testing of devices, boards and systems; covering the complete cycle from design verification, design-for-testing, design-for-manufacturing, silicon de-bugging, manufacturing testing, system testing, diagnosis, failure analysis... and back to process and design improvement. This will be an invaluable guide to the topics.