
Leon Golub, Chair/editor; Sponsored By Spie--the International Society For Optical Engineering; Cooperating Organizations, Applied Optics Laboratory/new Mexico State University... [et Al.]. Part Of A Three-conference Program On X-ray Instruments,, Multilayers, & Sources Held At Spie's 32nd Annual International Technical Symposium On Optical & Optoelectronic Applied Science & Engineering, 14-19 August 1988, San Diego, California--p. Vii. Includes Bibliographies And Index.
Page Count:
208
Publication Date:
1988-01-01
ISBN-10:
0819400173
ISBN-13:
9780819400178
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