Optical Metrology and Inspection for Industrial Applications II 5-7 November 2012, Beijing, China
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Author Description
Proceedings of SPIE present the original research papers presented at SPIE conferences and other high-quality conferences in the broad-ranging fields of optics and photonics. These books provide prompt access to the latest innovations in research and technology in their respective fields. Proceedings of SPIE are among the most cited references in patent literature.
Page Count:
328
Publication Date:
2013-01-02
ISBN-10:
081949318X
ISBN-13:
9780819493187