James R. Ehrstein profile picture

James R. Ehrstein

Is this your author profile? Create an account to claim and customize it!

Stand Alone

The Certification of 100 MM Diameter Silicon Resistivity Srms 2541 Through 2547 Using Dual-Configuration, Four-Point Probe Measurements, 1999 Edition (Classic Reprint)
The Certification of 100 MM Diameter Silicon Resistivity Srms 2541 Through 2547 Using Dual-Configuration, Four-Point Probe Measurements, 1999 Edition (Classic Reprint)