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Wai Kin Chim

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Semiconductor Device and Failure Analysis : Using Photon Emission Microscopy
Proceedings of the 1999 7th International Symposium on the Physical and Failure Analysis of Integrated Circuits [IPFA '99 : 5-9 July, 1999, Orchard Hotel, Singapore]
Proceedings of the 1997 6th International Symposium on the Physical & Failure Analysis of Integrated Circuits: 21-25 July, 1997, Raffles City Convention Centre, Singapore
Semiconductor device and failue analysis: using photon emission microscopy