NATO Advanced Research Workshop on Defects in High-K Dielectric Nano-electronic Semiconductor Devices (2005 Saint Petersburg, Russia) profile picture

NATO Advanced Research Workshop on Defects in High-K Dielectric Nano-electronic Semiconductor Devices (2005 Saint Petersburg, Russia)

Is this your author profile? Create an account to claim and customize it!

Stand Alone

Defects in high-k gate dielectric stacks