Author Description

This special edition addresses one of the most critical aspects of semiconductor technology: the presence and impact of defects within solid semiconductor materials on the performance and reliability of electronic devices. The presented edition will be useful to researchers and engineers in the semiconductor industry and will serve as an essential resource for those looking to deepen their understanding of the nature of defects in semiconductor structures and their influences on the efficiency and reliability of power electronic devices. SiC MOSFET, Basal Plane Dislocation, Epilayer, Bipolar Degradation, Defect Inspection, Post-Growth Thermal Treatment, Crystal Defects, Defect Decomposition Materials Science, Electronics, Nanoscience.