This book investigates the principles and applications of holographic interferometry, a technique that combines holography with interferometry to measure microscopic deformations and refractive index changes. Thomas E. Kreis, a recognized expert in the field, draws upon extensive research and practical experience to present a comprehensive overview of the subject. The work details the theoretical underpinnings, the mathematical formulations, and the experimental setups required for successful holographic interferometry. It explores various configurations and their suitability for different measurement challenges, providing a rigorous examination of the optical phenomena involved.

This text is recognized as a foundational work in holographic interferometry, offering a detailed and rigorous treatment of the subject. Its comprehensive scope and in-depth analysis make it a valuable resource for researchers and practitioners in optics and metrology. The book's methodical approach and clear explanations of complex optical principles are highly regarded within the scientific community.