Author Description

The product of the first ever China-Japan joint symposium in the field, presents and discusses state-of-the-art developments and their applications. The 49 papers deal not only with traditional aspects but also new techniques, such as fault-tolerance in parallel computing, techniques for tolerating software and hardware design faults as well as operator errors, and fault-tolerance techniques in VLSI. Author index only. Produced from typescripts of varying legibility. Annotation copyright Book News, Inc. Portland, Or.