
The factorization method is a relatively new method for solving certain types of inverse scattering problems and problems in tomography. Aimed at students and researchers in Applied Mathematics, Physics and Engineering, this text introduces the reader to this promising approach for solving important classes of inverse problems. The wide applicability of this method is discussed by choosing typical examples, such as inverse scattering problems for the scalar Helmholtz equation, a scattering problem for Maxwell's equation, and a problem in impedance and optical tomography. The last section of the book compares the Factorization Method to established sampling methods (the Linear Sampling Method, the Singular Source Method, and the Probe Method).
This text investigates the mathematical framework and practical application of the factorization method for solving inverse scattering and tomography problems. Authors Andreas Kirsch and Natalia Grinberg provide a structured introduction to this technique, drawing upon their expertise in applied mathematics to explain how the method identifies unknown shapes or objects from scattered wave data. The book serves as a technical resource for students and researchers who require a rigorous approach to solving inverse problems in physics and engineering.
What You Will Find
Scope Limits
Experts and researchers in the field of inverse problems recognize this work as a specialized, high-level reference for understanding the factorization method. Readers frequently note the technical density of the prose, which is tailored specifically for an audience of graduate-level mathematicians and engineers.
Page Count:
207
Publication Date:
2007-01-01
Publisher:
OUP Oxford
ISBN-10:
019152669X
ISBN-13:
9780191526695
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