
Defect and Microstructure Analysis by Diffraction looks at a key aspect of state-of-the-art methods for analyzing the actual structure of materials. Diffraction analysis is typically based on idealized crystals. The impurities and irregularities that work themselves into virtually all crystal structures, however, cause diffraction peak profiles to broaden and sometimes become asymmetric, making the data difficult to interpret. More powerful methods are undoing this effect, using the discrepancies themselves to describe microstructure of the material with unprecedented accuracy. These techniques in turn play a key role in many of the evolving techniques for microstructure analysis from diffraction patterns such as micro-strain, crystallite size, macro-strain and preferred orientation analysis. This book provides a comprehensive analysis of the fundamental theory and techniques for microstructure analysis from diffraction patterns and summarizes the current state of the art. It lays the foundation for the next and last major development in this field: the extraction of the full information in a powder pattern by the simulation of the full experimental pattern. The goal of this research is to extract all of the information locked in the powder diffraction pattern including the types and densities of stacking faults, the strain field produced by each, the anisotropic crystallite size and orientation, along with the size and strain distributions of each phase in a specimen.
This text investigates how diffraction peak profiles can be utilized to characterize the defects and microstructural irregularities inherent in real-world crystal materials. The authors, Hans J. Bunge, Jaroslav Fiala, and Robert L. Snyder, synthesize fundamental diffraction theory with advanced analytical techniques to address the limitations of idealized crystal models. By focusing on the discrepancies in diffraction data, the book provides a framework for extracting precise information regarding micro-strain, crystallite size, and preferred orientation in complex specimens.
What You Will Find
Experts recognize this monograph as a foundational reference for researchers working in materials science and crystallography. Readers frequently note the technical density of the prose, which is intended for advanced students and professionals familiar with diffraction physics.
Page Count:
808
Publication Date:
2000-03-16
Publisher:
International Union of Crystallography
ISBN-10:
0198501897
ISBN-13:
9780198501893
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