
Tolerance design techniques are playing an increasingly important role in maximizing the manufacturing yield of mass-produced electronic circuits. Tolerance Design of Electronic Circuits presents an account of design and analysis methods used to minimize the unwanted effects of component tolerances.Highlights of the book include- An overview of the concepts of Tolerance Analysis and Design- A detailed discussion of the Statistical Exploration Approach to tolerance design- An engineering discussion of the Monte Carlo statistical method- A presentation of several successful examples of the application of tolerance designThis book will be highly appropriate for professional Electronic Circuit Designers, Computer Aided Design Specialists, Electronic Engineering undergraduates and graduates taking courses in Advanced Electronic Circuit Design.
This text investigates the methodologies required to minimize the negative impacts of component tolerances on the manufacturing yield of mass-produced electronic circuits. Authors Randeep Singh Soin and Robert Spence draw upon their expertise in electronic systems engineering to provide a comprehensive framework for design and analysis. The book synthesizes theoretical concepts with practical engineering applications to assist designers in optimizing circuit performance under variable manufacturing conditions.
What You Will Find
Experts and practitioners in the field of electronic systems engineering recognize this work as a technical resource for circuit designers and CAD specialists. Readers frequently note the academic rigor and the specific focus on bridging the gap between theoretical statistical methods and real-world manufacturing constraints.
Page Count:
215
Publication Date:
1988-01-01
Publisher:
Addison-Wesley
ISBN-10:
0201182424
ISBN-13:
9780201182422
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