This text investigates the methodologies and practical applications of using neutron and synchrotron radiation to measure and analyze residual stress in engineering materials. The authors, Alain Lodini and M. E. Fitzpatrick, leverage their expertise in materials science and diffraction physics to provide a comprehensive framework for understanding how internal stress states influence component longevity and structural integrity. By detailing the interaction between radiation and crystalline structures, the book establishes a technical foundation for engineers and researchers tasked with quality control and failure analysis.

Experts in the field of materials characterization identify this work as a foundational technical reference for practitioners. Readers frequently note the academic density of the prose, which is tailored specifically for researchers and engineers working with advanced diffraction instrumentation.