
Statistics lectures have been a source of much bewilderment and frustration for generations of students. This book attempts to remedy the situation by expounding a logical and unified approach to the whole subject of data analysis. This text is intended as a tutorial guide for senior undergraduates and research students in science and engineering. After explaining the basic principles of Bayesian probability theory, their use is illustrated with a variety of examples ranging from elementary parameter estimation to image processing. Other topics covered include reliability analysis, multivariate optimization, least-squares and maximum likelihood, error-propagation, hypothesis testing, maximum entropy and experimental design. The Second Edition of this successful tutorial book contains a new chapter on extensions to the ubiquitous least-squares procedure, allowing for the straightforward handling of outliers and unknown correlated noise, and a cutting-edge contribution from John Skilling on a novel numerical technique for Bayesian computation called 'nested sampling'.
This book investigates how Bayesian probability theory provides a logical and unified framework for solving complex data analysis problems in science and engineering. Authors Devinderjit Sivia and John Skilling address the common frustration students face with traditional statistics by presenting a tutorial-based approach. They utilize foundational probability principles to demonstrate how these methods apply to practical tasks ranging from parameter estimation to advanced numerical computation.
What You Will Find
Scope Limits
Experts and educators frequently cite this text as a foundational resource for students transitioning into research-level data analysis. Readers often note that the prose maintains a high level of technical clarity while remaining accessible to those with a background in undergraduate science or engineering.
Page Count:
246
Publication Date:
2006-01-01
Publisher:
OUP Oxford
ISBN-10:
0191546704
ISBN-13:
9780191546709
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