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This collection of micrographs illustrates a variety of soils and sediments using both scanning and transmission electron micrographs and forms both an atlas for the experienced microscopist and an instructional manual for geologists, geotechnical engineers, and soil scientists.
This volume investigates the structural and morphological characteristics of various soil and sediment types through the application of advanced electron microscopy techniques. Authors N. Keith Tovey and Peter Smart leverage their extensive expertise in geotechnical research to provide a comprehensive visual and technical framework. By synthesizing scanning and transmission electron micrograph data, the authors establish a standardized reference for analyzing soil fabric and particle interaction at the microscopic level.
What You Will Find
Experts recognize this work as a foundational visual reference for professionals in geotechnical engineering and soil science. Readers frequently note the technical density of the imagery and its utility as a practical manual for laboratory analysis.
Page Count:
186
Publication Date:
1981-10-29
Publisher:
Oxford University Press
ISBN-10:
0198545150
ISBN-13:
9780198545156
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