This book investigates the application of neutron and synchrotron radiation for the analysis of residual stress in materials. It details the fundamental principles behind diffraction techniques, focusing on how these powerful radiation sources can probe the microscopic lattice strains that constitute residual stress. The work aims to provide a comprehensive overview of the methodologies, experimental considerations, and data interpretation required for accurate residual stress measurement using these advanced techniques.

The subject matter points to a technical and specialized text, likely aimed at researchers and advanced students in materials science, physics, and engineering. The focus on specific radiation sources suggests a detailed exploration of experimental methodologies and data analysis, indicating a dense and informative work. The book is expected to serve as a valuable resource for those needing to understand or implement diffraction-based methods for residual stress characterization.