
Diffuse X-ray scattering is a rich source of local structural information over and above that obtained by conventional crystal structure determination. The main aim of the book is to show how computer simulation of a model crystal provides a general method by which diffuse scattering of all kinds and from all types of materials can be interpreted and analysed.Since the first edition was published in 2004 there have been major improvements both in the experimental methods for recording diffuse scattering and in our ability to analyse it. The advent of new and better detectors means that fully 3-dimensional diffuse scattering data can be collected routinely for even quite small samples and computational power that is now available has continued its upward trend, meaning modelling calculations inconceivable in 2004 are now routine. The final part of the book traces these recent developments and outlines their future potential in the field.
This text investigates how computer simulation serves as a primary methodology for interpreting diffuse X-ray scattering data across diverse material types. T.R. Welberry, a recognized authority in crystallography, synthesizes decades of experimental and computational advancements to provide a framework for local structural analysis. The book argues that modern computational power and detector technology have transformed diffuse scattering from a specialized niche into a routine analytical tool for understanding disorder in crystal structures.
What You Will Find
Experts identify this monograph as a foundational reference for researchers utilizing diffuse scattering to study structural defects. Readers frequently note the technical density of the prose, which is tailored specifically for advanced students and professionals in the physical sciences.
Page Count:
424
Publication Date:
2022-08-01
Publisher:
Oxford University Press
ISBN-10:
0198862482
ISBN-13:
9780198862482
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