
Knowledge of the dynamics of many-electron systems is of fundamental importance to all disciplines of condensed matter physics. A very effective access to electron dynamics is offered by inelastic X-ray scattering (IXS) spectroscopy. The double differential scattering cross section for IXS is directly related to the time-dependent two-particle density correlation function, and, for large momentum and energy transfer (Compton limit) to the electron momentum distribution. Moreover, resonant inelastic X-ray scattering (RIXS) enables the study of electron dynamics via electronic excitations in a very selective manner (e.g. selectively spin, crystal momentum, or symmetry), so that other methods are efficaciously complemented. The progress of IXS spectroscopy is intimately related to the growing range of applications of synchrotron radiation. The aim of the book is to provide the growing community of researchers with accounts of experimental methods, instrumentation, and data analysis of IXS, with representative examples of successful applications, and with the theoretical framework for interpretations of the measurements.
This text investigates the application of inelastic X-ray scattering (IXS) as a primary diagnostic tool for understanding the dynamics of many-electron systems in condensed matter physics. Winfried Schuelke, an established expert in synchrotron radiation, provides a comprehensive framework that bridges the gap between theoretical scattering cross-sections and practical experimental implementation. The book argues that IXS, particularly when combined with resonant techniques, offers a unique, selective probe into electronic excitations that complements traditional spectroscopic methods.
What You Will Find
Scope Limits
Experts recognize this work as a foundational technical reference for researchers utilizing synchrotron radiation facilities. Readers frequently note the high academic density of the prose, which is tailored specifically for advanced practitioners in the field of condensed matter physics.
Page Count:
464
Publication Date:
2007-01-01
Publisher:
OUP Oxford
ISBN-10:
0191523283
ISBN-13:
9780191523281
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